JPH0249712Y2 - - Google Patents
Info
- Publication number
- JPH0249712Y2 JPH0249712Y2 JP15269484U JP15269484U JPH0249712Y2 JP H0249712 Y2 JPH0249712 Y2 JP H0249712Y2 JP 15269484 U JP15269484 U JP 15269484U JP 15269484 U JP15269484 U JP 15269484U JP H0249712 Y2 JPH0249712 Y2 JP H0249712Y2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor wafer
- stage
- adhesive tape
- hole
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 78
- 239000002390 adhesive tape Substances 0.000 claims description 22
- 238000012360 testing method Methods 0.000 claims description 7
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 235000012431 wafers Nutrition 0.000 description 62
- 239000008188 pellet Substances 0.000 description 8
- 230000001681 protective effect Effects 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- -1 wire bonding Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15269484U JPH0249712Y2 (en]) | 1984-10-09 | 1984-10-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15269484U JPH0249712Y2 (en]) | 1984-10-09 | 1984-10-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6166940U JPS6166940U (en]) | 1986-05-08 |
| JPH0249712Y2 true JPH0249712Y2 (en]) | 1990-12-27 |
Family
ID=30710747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15269484U Expired JPH0249712Y2 (en]) | 1984-10-09 | 1984-10-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0249712Y2 (en]) |
-
1984
- 1984-10-09 JP JP15269484U patent/JPH0249712Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6166940U (en]) | 1986-05-08 |
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